SERVICES

Aser "Soft Error" Activities

Cosmic Rays (Neutrons), Alpha Particles, Protons, Heavy Ions and Dose tests

EASii IC Soft Error Test service is a complete solution to Radiation Effects characterization on electronic devices, for Foundries, Fabless companies and System Integrators in Commercial electronic products, Space, Avionics, Automotive and High reliability environments.

We use Full custom high performance test equipment, dedicated to device and system characterization in radiative environments, compatible with almost all radiation sources around the world, able to set up device at full speed, high or low temperature and in vacuum conditions.

Soft Error

The test service complies with the current radiation test standards:

  • JEDEC JESD89 Test standard for Atmospheric Neutrons and Alpha particles
  • ESA Specifications for Radiation tests and Total Dose tests
  • US Test Standard MIL-STD-883
  • Automotive AEC Q100 tests for Soft Error measurements

OUR METHODOLOGY:

  • 1. Case by case study of the device or equipment and its radiation environment.
  • 2. Test proposal with detailed test conditions and experiment plan.
  • 3. Design of custom test boards and test environment setup for the device at the considered test facility.
  • 4. Test of the device under particle beam with qualified engineers.
  • 5. Data post analysis and results synthesis, customized depending on your needs.

Soft Error

News and Events - Easii-ic

Oct 2011 : The GIF will welcome 150 start-ups and laboratories in an exhibition space dedicated to networking with industry and technology demonstrations. More than 1,500 people from all over Europe will be taking part in GIF11...

July 2011 : X-Rel Semiconductor, a spin-off of EASii IC specialized in the design and market of High-reliability and High-temperature ICs, becomes Corporate Sponsor of HiTEN 2011, the International Conference and Exhibition on High temperature Electronics Network to be held on July 18-20 in Oxford, United Kingdom.

June 2011 : CAP'TRONIC conference: How to innovate and integrate electronic devices in systems designed for the nuclear market David Gauthier (EASii-IC) will present the effects of radiation on electronic devices.

More

We
RECRUIT

Because your career is also ours, we take care, best suited to your needs and following your career.

More